afm

 Photography by Gabiele Photography

AFM

Atomic Force Microscopy (AFM) is a technique used to obtain the physical properties of surfaces at a nanometric level, such as: roughness, elastic properties, friction, and piezo- ferro-electricity. Actually, this technique allows to obtain a 3D topography of a sample's surface. More in practice, AFM consists of a mechanical arm, called cantilever, which has a very small pyramid shaped tip that is dragged across the sample's surface. Over the cantilever there's a laser beam that “follows” the changed in the position generated by the surface of the sample, and sends this information to a photodetector. Finally, the results are processed and displayed in an image that reflects the morphology of the sample.

At SAOM-Lab we can perform sample characterization in order to:

Determine mechanical, electrical and magnetic properties.
Know which materials the sample is made out of, their distribution and quantity, by means of their elastic properties.
Deliver a highly accurate and detailed map of the sample's composition.
Topografic analysis of biologic samples.

All that is required is a small sample to perform AFM into it, and our team of experts will do the job for you. Please, don't hesitate to contact us using order to find together the best way we can help you to solve your problem.

 

Contact us

Phone

(+52) 646-1750650. Ext: 433, 382.

Email

info@saomlab.com

Address

CNyN-UNAM Carretera Tijuana-Ensenada Km. 107, Pedregal Playitas, 22860 Ensenada, B.C.

 

Facilities

State of the art technology for thin film deposition, spectroscopic analysis, and laser ablation. Technical information about the ellipsometers, spectrometers, lasers, AFM Park System machines, and thin film deposition equipment available at SAOMLab.

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External Links

UNAM

CNyN

Photography by

Gabiele Photography

Website Development by

Melany Mendoza